Last Updated： Aggregation Period:Jan 28, 2026～Feb 24, 2026
This ranking is based on the number of page views on our site.
Last Updated： Aggregation Period:Jan 28, 2026～Feb 24, 2026
This ranking is based on the number of page views on our site.
Last Updated： Aggregation Period:Jan 28, 2026～Feb 24, 2026
This ranking is based on the number of page views on our site.
1～20 item / All 20 items
The four-probe method allows for easy measurement of the sheet resistance of conductive materials.
This is a manual type measuring device that uses the four-probe method to easily and accurately measure the sheet resistance or resistivity of semiconductor and metal thin films. The measurement capability ranges from 1.000 mΩ-cm to 500 KΩ-cm.
![Resistance rate / Sheet resistance measuring instrument [NC-10]](https://image.mono.ipros.com/public/product/image/0b0/215440002/IPROS_17436793690022820000.jpg?w=280&h=280)
Resistance rate / Sheet resistance measuring instrument [NC-10]
Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.
![Resistance rate / Sheet resistance measuring instrument [WS-3000]](https://image.mono.ipros.com/public/product/image/9e5/215440005/IPROS_17039821349121462000.jpg?w=280&h=280)
Resistance rate / Sheet resistance measuring instrument [WS-3000]
Napson Co., Ltd. develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.
![Resistance rate / Sheet resistance measuring instrument [NC-80MAP]](https://image.mono.ipros.com/public/product/image/7d3/215440011/IPROS_11308252552811290000.jpg?w=280&h=280)
Resistance rate / Sheet resistance measuring instrument [NC-80MAP]
Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and our extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.
![Resistance rate / Sheet resistance measuring instrument [RT-3000/RG-1000F]](https://image.mono.ipros.com/public/product/image/c68/215440012/IPROS_13940550127942627000.JPG?w=280&h=280)
Resistance rate / Sheet resistance measuring instrument [RT-3000/RG-1000F]
Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.
![Resistance Rate / Sheet Resistance Measuring Instrument [RT-3000/RS-1300]](https://image.mono.ipros.com/public/product/image/1aa/215440015/IPROS_14068316182185260000.JPG?w=280&h=280)
Resistance Rate / Sheet Resistance Measuring Instrument [RT-3000/RS-1300]
Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.
![Resistance rate / Sheet resistance measuring instrument [CRESBOX]](https://image.mono.ipros.com/public/product/image/4ff/215440021/IPROS1524803647072082788.jpg?w=280&h=280)
Resistance rate / Sheet resistance measuring instrument [CRESBOX]
Napson Co., Ltd. develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.
Excellent measurement linearity over a wide range! Can be verified on a PC monitor as a three-dimensional graphic map.
The "LEI-1510 series" is a non-contact sheet resistance measurement device manufactured by the former Reihiton company. By attaching a robot, it is possible to quickly measure and process multiple samples. It solves the reproducibility issues caused by probe contact contamination and the contact condition that occur with the four-probe method. It measures sheet resistance non-contact and destructively for Si wafers ranging from 2 inches to a maximum of 8 inches, as well as compound semiconductor (GaAs, GaN, InP, etc.) epi wafers. 【Features】 - Solves reproducibility issues caused by probe contact contamination and contact conditions - Capable of quickly measuring and processing multiple samples - Excellent measurement linearity over a wide range of 0.035 to 3200 ohm/sq. - Measurement data can be viewed as a three-dimensional graphic map on a PC monitor *For more details, please refer to the PDF document or feel free to contact us.
Ideal for research and development of thin films for next-generation semiconductor devices. Achieves low cost.
The "Sheet Resistance Measurement Device" equipped with an optical stopper function can measure the surface resistance distribution at fine intervals (sub-micron to several tens of microns) using a micro four-terminal probe. By narrowing the functionality to applications in next-generation research and development, it achieves a low price while enabling resistance distribution measurement in fine areas of thin film surfaces in electronic devices. The optical stopper function is standardly equipped, stopping any pressing beyond a certain level even when there is no current, thus protecting the probe. For more details, please download the catalog.
Introducing SURAGUS products that provide solutions specialized in non-destructive testing.
Richmore International Co., Ltd. is the Japanese representative of the German company SURAGUS, which develops, manufactures, and sells measurement and inspection solutions based on eddy current testing technology. This document features products such as the "Portable Contact Sheet Resistance Meter" from SURAGUS, as well as "Non-Contact Sheet Resistance Measurement Devices" and "Non-Contact Sheet Resistance Mapping Devices." We provide non-destructive testing solutions for composite materials such as conductive thin films and low/high conductivity boundary layers. [Contents] ■ Overview of SURAGUS ■ Product Introduction ■ Overview of the Japanese Representative Company *For more details, please refer to the PDF document or feel free to contact us.
For non-contact measurements such as photovoltaic cells, semiconductors, and transparent static electricity prevention plates!
The "EddyCus(R) TF lab 4040SR-OT-OR-H" is a non-contact sheet resistance and optical transmission measurement device that can accurately measure the sheet resistance (Ohm/sq), light transmittance, and reflection of conductive thin films. It features manual mapping through user-friendly software and is used for measuring photovoltaic cells, semiconductors, and transparent antistatic plates. Precise measurements of conductive thin films, self-supporting structures, and grid/wire structures are possible. 【Features】 ■ Non-contact measurement ■ Real-time measurement ■ Precise measurement ■ User-friendly software ■ Manual mapping *For more details, please refer to the PDF document or feel free to contact us.
A device suitable for measuring anisotropy such as batteries and fuel cells, as well as sheet resistance.
The "EddyCus(R)TF lab 4040 SR-A" is a non-contact sheet resistance measurement device for anisotropic testing. Manual mapping measurements can be performed with software. It is suitable for accurate measurement of both anisotropic and isotropic films. 【Features】 ■ Non-contact measurement ■ Real-time measurement ■ Manual mapping with software ■ Accurate measurement of anisotropic and isotropic films *For more details, please refer to the PDF document or feel free to contact us.
Resistance Rate / Sheet Resistance Measuring Instrument 【EC-80】
Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.
![FPD Sheet Resistance Measurement Device [NC-50/RG-1200S]](https://image.mono.ipros.com/public/product/image/902/215440014/IPROS_16777993257882067000.JPG?w=280&h=280)
FPD Sheet Resistance Meter [NC-50/RG-1200S]
Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.
![Resistance Rate / Sheet Resistance Meter [WS-8800]](https://image.mono.ipros.com/public/product/image/4a9/215440017/IPROS_15833058799461515000.JPG?w=280&h=280)
Resistance rate / Sheet resistance measuring instrument [WS-8800]
Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.
Using the JPV method, non-contact measurement of junction leakage in PN junctions, evaluation of the depletion layer capacitance, and rapid measurement of the sheet resistance of PN junction samples!
The JPV method (Junction Photo Voltage method) allows for fast and reproducible mapping measurements. 【Features】 - Non-contact, non-destructive measurement - No adjustment of probes required - No special sample preparation needed for measurement - Measurement possible even with oxide films or coatings on the surface - High spatial resolution distribution measurement (mapping) can be performed quickly - Highly reproducible measurements are possible - Can be integrated with Semilab's benchtop platforms WT-2000, WT-2500, WT-3000, or inline wafer testing equipment.
Achieving high-precision measurements over a wide measurement range without causing physical damage to the sample!
"DELCOM" is a non-contact sheet resistance measurement system using the DC eddy current method. It is used in research and development, inspection processes, and manufacturing lines for semiconductor/LCD substrates, solar cell cells, flexible materials, and various conductive films, achieving high-precision measurements over a wide measurement range without causing physical damage to the samples. The measurement applications include semiconductors, ITO films, graphene & carbon, capacitive metal wheels, and electromagnetic wave absorbing materials. 【Features】 ■ Non-contact sheet resistance measurement system using the DC eddy current method ■ Does not cause physical damage to samples in research and development, inspection processes, and manufacturing lines ■ Achieves high-precision measurements over a wide measurement range ■ The measurement range can be selected from four ranges according to the resistance range *For more details, please refer to the PDF document or feel free to contact us.
Data management on PC via Bluetooth! A user-friendly and efficient testing solution.
The "EddyCus(R) TF portable" is a portable contact-type sheet resistance meter that accurately measures the sheet resistance of conductive films at a single point. It features user-friendly software that allows for real-time measurements. Measurement results from multiple devices are managed and visualized using a data sensor. Additionally, wireless data transfer via Bluetooth is possible. 【Features】 ■ Portable ■ Non-destructive contact measurement ■ Real-time & user-friendly ■ Data recording function ■ Accurate & reliable *For more details, please refer to the PDF document or feel free to contact us.
A suitable solution for measuring the thickness of metal layers, light transmittance, density, and electrical anisotropy.
The "EddyCus(R) TF inline series" is a non-contact inline sheet resistance measurement solution capable of measuring the sheet resistance of thin films and the thickness of metal film layers. It offers advanced variability and flexibility, suitable for both vacuum and atmospheric environments. Equipped with an easy-to-use GUI, comprehensive software, SQL database, statistics, and export functions. 【Features】 ■ Non-contact & real-time measurement ■ Accurate measurements ■ Advanced variability and flexibility ■ Compatible with both vacuum and atmospheric environments ■ Supports single lane and multiple lanes *For more details, please refer to the PDF document or feel free to contact us.
Manual mapping measurements of sheet resistance are possible using user-friendly software.
The "EddyCus(R)TF lab 2020 series" is a non-contact sheet resistance measurement device. It accurately measures the sheet resistance of conductive films at a single point. Additionally, it can measure the thickness of metal film layers and monitor the thickness of thin films and substrates. Upon request, we evaluate the characteristics of multi-layer systems. 【Features】 ■ Non-contact type ■ Real-time measurement ■ Accurate single-point measurement of sheet resistance of conductive films (Ohm/sq) ■ Thickness measurement of metal film layers (nm) *For more details, please refer to the PDF document or feel free to contact us.
