1～12 item / All 12 items
The four-probe method allows for easy measurement of the sheet resistance of conductive materials.
This is a manual type measuring device that uses the four-probe method to easily and accurately measure the sheet resistance or resistivity of semiconductor and metal thin films. The measurement capability ranges from 1.000 mΩ-cm to 500 KΩ-cm.
![Resistance rate / Sheet resistance measuring instrument [NC-10]](https://image.mono.ipros.com/public/product/image/0b0/215440002/IPROS_17436793690022820000.jpg?w=280&h=280)
Resistance rate / Sheet resistance measuring instrument [NC-10]
Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.
![Resistance rate / Sheet resistance measuring instrument [WS-3000]](https://image.mono.ipros.com/public/product/image/9e5/215440005/IPROS_17039821349121462000.jpg?w=280&h=280)
Resistance rate / Sheet resistance measuring instrument [WS-3000]
Napson Co., Ltd. develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.
![Resistance rate / Sheet resistance measuring instrument [NC-80MAP]](https://image.mono.ipros.com/public/product/image/7d3/215440011/IPROS_11308252552811290000.jpg?w=280&h=280)
Resistance rate / Sheet resistance measuring instrument [NC-80MAP]
Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and our extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.
![Resistance rate / Sheet resistance measuring instrument [RT-3000/RG-1000F]](https://image.mono.ipros.com/public/product/image/c68/215440012/IPROS_13940550127942627000.JPG?w=280&h=280)
Resistance rate / Sheet resistance measuring instrument [RT-3000/RG-1000F]
Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.
![Resistance Rate / Sheet Resistance Measuring Instrument [RT-3000/RS-1300]](https://image.mono.ipros.com/public/product/image/1aa/215440015/IPROS_14068316182185260000.JPG?w=280&h=280)
Resistance Rate / Sheet Resistance Measuring Instrument [RT-3000/RS-1300]
Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.
![Resistance rate / Sheet resistance measuring instrument [CRESBOX]](https://image.mono.ipros.com/public/product/image/4ff/215440021/IPROS1524803647072082788.jpg?w=280&h=280)
Resistance rate / Sheet resistance measuring instrument [CRESBOX]
Napson Co., Ltd. develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.
Excellent measurement linearity over a wide range! Can be verified on a PC monitor as a three-dimensional graphic map.
The "LEI-1510 series" is a non-contact sheet resistance measurement device manufactured by the former Reihiton company. By attaching a robot, it is possible to quickly measure and process multiple samples. It solves the reproducibility issues caused by probe contact contamination and the contact condition that occur with the four-probe method. It measures sheet resistance non-contact and destructively for Si wafers ranging from 2 inches to a maximum of 8 inches, as well as compound semiconductor (GaAs, GaN, InP, etc.) epi wafers. 【Features】 - Solves reproducibility issues caused by probe contact contamination and contact conditions - Capable of quickly measuring and processing multiple samples - Excellent measurement linearity over a wide range of 0.035 to 3200 ohm/sq. - Measurement data can be viewed as a three-dimensional graphic map on a PC monitor *For more details, please refer to the PDF document or feel free to contact us.
Resistance Rate / Sheet Resistance Measuring Instrument 【EC-80】
Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.
![FPD Sheet Resistance Measurement Device [NC-50/RG-1200S]](https://image.mono.ipros.com/public/product/image/902/215440014/IPROS_16777993257882067000.JPG?w=280&h=280)
FPD Sheet Resistance Meter [NC-50/RG-1200S]
Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.
![Resistance Rate / Sheet Resistance Meter [WS-8800]](https://image.mono.ipros.com/public/product/image/4a9/215440017/IPROS_15833058799461515000.JPG?w=280&h=280)
Resistance rate / Sheet resistance measuring instrument [WS-8800]
Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.
Achieving high-precision measurements over a wide measurement range without causing physical damage to the sample!
"DELCOM" is a non-contact sheet resistance measurement system using the DC eddy current method. It is used in research and development, inspection processes, and manufacturing lines for semiconductor/LCD substrates, solar cell cells, flexible materials, and various conductive films, achieving high-precision measurements over a wide measurement range without causing physical damage to the samples. The measurement applications include semiconductors, ITO films, graphene & carbon, capacitive metal wheels, and electromagnetic wave absorbing materials. 【Features】 ■ Non-contact sheet resistance measurement system using the DC eddy current method ■ Does not cause physical damage to samples in research and development, inspection processes, and manufacturing lines ■ Achieves high-precision measurements over a wide measurement range ■ The measurement range can be selected from four ranges according to the resistance range *For more details, please refer to the PDF document or feel free to contact us.
